EMC Surge Test Introduction

The China JJR EMC laboratory is equipped with two 1.2/50µs generators, one power coupling/decoupling network, one 10/700µs generator, and one communication port coupling/decoupling network. It has complete EMC Surge Testing capabilities!

What is a Surge (SURGE) EMC Test?

A Surge (SURGE) EMC test is an important test used to assess the electromagnetic interference immunity of electronic devices under instantaneous voltage fluctuations. It simULates phenomena that could occur in real-world environments, such as power failures and lightning strikes, to test the device's ability to function in a harsh electromagnetic environment. For example, after a lightning strike, whether the electronic device can continue to operate normally.

What is an EOS Test?

EOS, or Electrical Over Stress, refers to excessive electrical stress. When external current or voltage exceeds the maximum tolerance of a device, its performance degrades or it may be damaged directly.

Instrument Overview:

1. TVS8-20TC

2. SUG61005TAX

3. SUG-CDN-10

4. SUG 10700G

5. DATA-CDN-8B

The 1.2/50µs composite wave generator outputs voltage for testing from 0.2–10KV, and the coupling/decoupling network can perform tests for L-N, L-PE, N-PE, and L-N-PE, among other options. Another 1.2/50µs composite wave generator outputs voltage for testing from 3–1000V, capable of performing EOS testing and low-voltage surge testing, meeting the surge testing needs of various power supply products and HUB-type products.

The 10/700µs composite wave generator outputs voltage for testing from 0.2–6KV, and the coupling/decoupling network has multiple resistance options, including 40Ω, 80Ω, 160Ω, 200Ω, and 320Ω, to meet the surge testing needs of 100M and 1G network interfaces.

Test Port Types:

1. AC power ports (L-N, L-PE, N-PE, L-N-PE)

2. DC ports

3. Communication ports (RJ45, RS232, RS485, coaxial, etc.)